Systems Engineering and Electronics ›› 2020, Vol. 42 ›› Issue (12): 2944-2952.doi: 10.3969/j.issn.1001-506X.2020.12.33
Bo LI1,2(), Lin ZHANG1(
), Wenfeng WANG1,*(
), Guannan WANG3(
)
Received:
2020-03-06
Online:
2020-12-01
Published:
2020-11-27
Contact:
Wenfeng WANG
E-mail:libo.ing@foxmail.com;csdmmsh0@163.com;rfvmju01@163.com;979854590@qq.com
CLC Number:
Bo LI, Lin ZHANG, Wenfeng WANG, Guannan WANG. Fault feature extraction method based on Park-HHT[J]. Systems Engineering and Electronics, 2020, 42(12): 2944-2952.
Table 3
Fault characteristic values extracted by HHT method"
类别 | 故障模式 | ia | ib | ic | |||||
IMF5 | IMF6 | IMF5 | IMF6 | IMF5 | IMF6 | ||||
1 | 正常 | 0.650 | 0.084 | 0.705 | 0.066 | 0.928 | 0.026 | ||
2 | T1开路 | 0.077 | 0.307 | 0.613 | 0.061 | 0.922 | 0.114 | ||
3 | T3开路 | 1.504 | 0.433 | 0.309 | 0.682 | 2.271 | 0.101 | ||
4 | T5开路 | 1.838 | 0.493 | 1.768 | 0.338 | 0.445 | 1.221 | ||
5 | T3、T5开路 | 1.458 | 0.362 | 1.111 | 0.584 | 0.194 | 0.548 |
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