距离弯曲差对SAR欺骗干扰成像的影响

Journal of Systems Engineering and Electronics ›› 2009, Vol. 31 ›› Issue (10): 2343-2345,2475.

距离弯曲差对SAR欺骗干扰成像的影响

杨伟宏^1,2, 陈永光^1,2, 王雪松¹, 李永祯¹

1. 国防科技大学电子科学与工程学院, 湖南, 长沙, 410073;
2. 中国人民解放军63880部队, 河南, 洛阳, 471003

收稿日期:2008-10-23 修回日期:2009-07-24 出版日期:2009-10-20 发布日期:2010-01-03
作者简介:杨伟宏(1978- ),男,博士研究生,主要研究方向为复杂电子系统仿真和评估.E-mail:whyang.2006@163.com
基金资助:
国家科学自然基金(60802078)资助课题

Effect caused by range curvature distinction for deception jamming under SAR imaging

YANG Wei-hong^1,2, CHEN Yong-guang^1,2, WANG Xue-song¹, LI Yong-zhen¹

1. School of Electronic Science and Engineering, National Univ. of Defense Technology, Changsha 410073, China;
2. Unit 63880 of the PLA, Luoyang 471003, China

Received:2008-10-23 Revised:2009-07-24 Online:2009-10-20 Published:2010-01-03

摘要/Abstract

摘要： 研究有源欺骗干扰难以补偿距离弯曲差形成的相位差对距离弯曲差对SAR成像质量的影响.建立了含干扰SAR成像的矩阵模型,分析了高精度成像算法下有源欺骗干扰成像中距离弯曲差的累积散焦效应,比较了R-D算法和CS算法等不同成像算法在不同距离弯曲差区域内含干扰的保护目标区的成像性能.仿真验证了在大场景高精度成像算法下有源欺骗干扰的散焦效应,为改进SAR干扰对抗方式提供借鉴.

Abstract: The jamming imaging effect caused by range curvature distinction under synthetic aperture radar(SAR) imaging is studied.The imaging matrix model is established firstly,which is simplified for signals and jamming.And the defocusing effect is analyzed in high-accuracy imaging algorithm,caused by range curvature distinction under SAR imaging.Then a comparison between R-D and CS imaging algorithms for utilizing in the regions of various range curvature distinctions including real targets and gamming is studied.Finally,simulation experiment verifies the defocusing effect coused by active deceptive jamming in wide scenes in the high accuracy imaging algorithm,which is conductive to an improvement in electronic counter measures(ECM) to SAR.

中图分类号:

TN958

杨伟宏, 陈永光, 王雪松, 李永祯. 距离弯曲差对SAR欺骗干扰成像的影响[J]. Journal of Systems Engineering and Electronics, 2009, 31(10): 2343-2345,2475.

YANG Wei-hong, CHEN Yong-guang, WANG Xue-song, LI Yong-zhen. Effect caused by range curvature distinction for deception jamming under SAR imaging[J]. Journal of Systems Engineering and Electronics, 2009, 31(10): 2343-2345,2475.

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