Systems Engineering and Electronics ›› 2021, Vol. 43 ›› Issue (12): 3725-3731.doi: 10.12305/j.issn.1001-506X.2021.12.37
• Reliability • Previous Articles Next Articles
Zelong MAO1, Zhihua WANG1,*, Qiong WU2, Chengrui LIU3
Received:
2020-12-28
Online:
2021-11-24
Published:
2021-11-30
Contact:
Zhihua WANG
CLC Number:
Zelong MAO, Zhihua WANG, Qiong WU, Chengrui LIU. Bivariate and two-stage degradation modeling and reliability analysis[J]. Systems Engineering and Electronics, 2021, 43(12): 3725-3731.
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