基于CGSPN的复杂电子系统测试性参数确定方法

doi:10.12305/j.issn.1001-506X.2025.05.15

系统工程与电子技术 ›› 2025, Vol. 47 ›› Issue (5): 1525-1535.doi: 10.12305/j.issn.1001-506X.2025.05.15

• 系统工程 • 上一篇

基于CGSPN的复杂电子系统测试性参数确定方法

张超¹^,²^,*, 房颖涛¹^,³, 董志杰⁴, 何世烈¹^,⁵, 周振威⁵

1. 西北工业大学航空学院, 陕西西安 710072
2. 飞行器基础布局全国重点实验室, 陕西西安 710072
3. 中国人民解放军77110部队, 四川德阳 618000
4. 中国电子信息产业集团有限公司第六研究所, 北京 100083
5. 中国电子产品可靠性与环境试验研究所, 广东广州 511370

收稿日期:2024-07-31 出版日期:2025-06-11 发布日期:2025-06-18
通讯作者: 张超
作者简介:张超 (1977—), 男, 教授, 博士, 主要研究方向为测试性设计、故障诊断、容错控制
房颖涛 (1990—), 男, 硕士研究生, 主要研究方向为测试性设计
董志杰 (1991—), 男, 工程师, 硕士, 主要研究方向为信号处理
何世烈 (1982—), 男, 高级工程师, 硕士, 主要研究方向为装备故障预测与健康管理
周振威 (1983—), 男, 高级工程师, 博士, 主要研究方向为故障预测与健康管理、可靠性统计
基金资助:
国家级重点科研项目(JSZL2022607B002);国家级重点科研项目(JSZL202160113001);国家级重点科研项目(JCKY2021608B018);国家科研项目(2023YFF0719100);工业和信息化部项目(CEIEC-2022-ZM02-0249)

Research ondetermination method for testability parameters of complex electronic systems based on CGSPN

Chao ZHANG¹^,²^,*, Yingtao FANG¹^,³, Zhijie DONG⁴, Shilie HE¹^,⁵, Zhenwei ZHOU⁵

1. School of Aeronautics, Northwestern Polytechnical University, Xi'an 710072, China
2. National Key Laboratory of Aircraft Configuration Design, Xi'an 710072, China
3. Unit 77110 of the PLA, Deyang 618000, China
4. The 6th Research Institute of China Electronics Corporation, Beijing 100083, China
5. China Electronic Product Reliability and Environmental Testing Institute, Guangzhou 511370, China

Received:2024-07-31 Online:2025-06-11 Published:2025-06-18
Contact: Chao ZHANG

摘要/Abstract

摘要：

因大量采用分布式、综合化、模块化方案, 复杂电子系统极易出现共因故障和故障并发等新问题, 传统测试性参数确定方法难以解决。针对这一问题, 提出一种基于着色广义随机Petri网(colored generalized stochastic Petri nets, CGSPN)的复杂电子系统测试性参数确定新方法。首先, 综合需求信息、约束边界和维修保障等要求, 建立电子系统两层级CGSPN模型, 引入着色，实现不同模块各种状态的实时追踪和故障并发处理, 通过广义随机处理共因故障的随机不确定性；然后, 利用着色和可用度探索一种带有冗余设计的测试性参数处理手段, 丰富测试性体系；最后, 构建一种不同模块、各种状态融合的并行分析技术, 统一系统层和模块层之间的状态转移关系, 避免分阶段串行处理和等效替换。以通信导航识别系统为例进行实例分析, 所提方法比传统方法具有更好的可用性和有效性。

关键词: 电子系统, 测试性参数, 着色广义随机Petri网, 共因故障, 故障并发

Abstract:

Due to the extensive use of distributed, integrated, and modular solutions, complex electronic systems are prone to new issues such as common-cause failures and fault concurrency, which are difficult to address using traditional methods for determining testability parameters. To address the above issue, a novel method for determining testability parameters for complex electronic systems based on colored generalized stochastic Petri nets (CGSPN) is proposed. Firstly, by incorporating requirements such as demand information, constraint boundaries, and maintenance support, a two-level CGSPN model for electronic systems is established. Coloring is introduced to enable real-time tracking of various states of different modules and to handle fault concurrency, while generalized stochastic processing addresses the randomness of common-cause failures.Secondly, a testability parameter processing method incorporating redundancy design is explored through coloring and availability, which enriches the testability system. Finally, a parallel analysis technique integrating different modules and various states is developed, unifying the state transition relationships between system and module levels, and avoiding stage-wise serial processing and equivalent replacement. An example analysis of communication navigation identification (CNI) system demonstrates that the proposed method offers better usability and effectiveness compared to traditional approaches.

Key words: electronic systems, testability parameters, colored generalized stochastic Petri nets (CGSPN), common-cause failures, fault concurrency

中图分类号:

TP206
TH702

张超, 房颖涛, 董志杰, 何世烈, 周振威. 基于CGSPN的复杂电子系统测试性参数确定方法[J]. 系统工程与电子技术, 2025, 47(5): 1525-1535.

Chao ZHANG, Yingtao FANG, Zhijie DONG, Shilie HE, Zhenwei ZHOU. Research ondetermination method for testability parameters of complex electronic systems based on CGSPN[J]. Systems Engineering and Electronics, 2025, 47(5): 1525-1535.

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库所符号	含义
P₀	LRM_i模块正常工作
P_{1_i}	LRM_i模块处于故障状态
P_{2_i}	故障检测结束
P_{3_i}	故障无法检测
P_{4_i}	检测到故障
P_{5_i}	人工隔离结束
P_{6_i}	故障修复结束
P_{7_i}	机器隔离结束
P_{8_i}	故障不能隔离
P_{9_i}	故障已隔离
P₁₀	CBM正常
P₁₁	CBM故障

变迁符号	单位	含义
t_{0_i}	h^－1	发生虚警速率
t_{1_i}	h^－1	发生故障速率
t_{2_i}	h^－1	故障检测速率
t_{3_i}	—	故障不能检测率
t_{4_i}	—	故障检测率
t_{5_i}	h^－1	人工隔离速率
t_{6_i}	h^－1	强制性维修速率
t_{7_i}	h^－1	机器隔离速率
t_{8_i}	—	故障不能隔离率
t_{9_i}	—	故障隔离率
t_{10_i}	h^－1	模糊维修速率
t_{11_i}	h^－1	精确维修速率
t_{12_i}	h^－1	检验安装速率
t₁₃	h^－1	CBM发生故障速率
t₁₄	h^－1	CBM故障修复速率

单元	λ_{_i}	μ_{1_i}	μ_{2_i}	μ_{3_i}	μ_{4_i}	MTTR	λ_{_g}	μ_{_g}
LRM_1	0.01	2	1	2	1	t	—	—
LRM_2	0.02	4	2	4	0.8	0.8t	—	—
LRM_3	0.03	2	1	2	0.8	1.2t	—	—
LRM_4	0.04	1	0.5	1	0.3	2t	—	—
LRM_5	—	—	—	—	—	—	0.01	1

单元	测试性参数
单元	η_{D_i}/h^-1	η_{I_i}/h^-1	η_{P_i}/h^-1	γ_{FD_i}	γ_{FI_i}	λ_{FA_i}/h^-1	γ_{FA_i}/%
LRM_1	10	10	0.5	0.90	0.85	0.000 47	4.49
LRM_2	10	5	0.5	0.90	0.80	0.000 65	3.15
LRM_3	10	5	0.5	0.70	0.70	0.002 90	8.81
LRM_4	10	5	0.5	0.85	0.80	0.000 39	0.97

方法	算法对比分析
方法	随机性问题	不确定性问题	并发问题	冗余问题	共因问题	特点
类比法	×	×	×	×	×	不合理, 需要类似装备。
经验法	×	×	×	×	×	不合理, 需要以往经验。
权衡法	×	×	×	×	×	不合理, 需要类似装备。
PN	×	×	×	×	×	无法处理随机性和时间因素, 因此不适合建模具有时序和随机性的系统。
SPN	√	×	×	√	√	无法处理时间因素, 因此不适合建模具有时序的系统。
GSPN	√	√	×	√	√	可以描述系统不确定性与随机性, 无法描述故障并发问题, 面对复杂系统建模能力有限。
DSPN	√	√	×	√	√	在GSPN基础上增加确定时间变迁, 但依旧无法描述故障并发问题, 面对复杂系统建模能力有限。
CGSPN	√	√	√	√	√	由于引入着色概念, 能够处理系统并发问题, 建模更加灵活, 能够更好地描述多类资源的系统行为。

基于CGSPN的复杂电子系统测试性参数确定方法

Research ondetermination method for testability parameters of complex electronic systems based on CGSPN

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