Remaining useful life prediction method for degradation equipment with random shocks#br#
BAI Can1,2, HU Changhua1, SI Xiaosheng1, LI Hongpeng2, ZHANG Zhengxin1, PEI Hong1
1. Test Teaching and Research Section of Rocket Military Engineering University, Xi’an 710025, China;
2. Beijing Institute of Remote Sensing Equipment, Beijing 100854, China
BAI Can, HU Changhua, SI Xiaosheng, LI Hongpeng, ZHANG Zhengxin, PEI Hong. Remaining useful life prediction method for degradation equipment with random shocks#br#[J]. Systems Engineering and Electronics, 2018, 40(12): 2729-2735.