Remaining useful life prediction method for degradation equipment with random shocks#br#
BAI Can, HU Changhua, SI Xiaosheng, LI Hongpeng, ZHANG Zhengxin, PEI Hong
Systems Engineering and Electronics . 2018, (12): 2729 -2735 .  DOI: 10.3969/j.issn.1001-506X.2018.12.16