Systems Engineering and Electronics ›› 2017, Vol. 39 ›› Issue (12): 2665-2670.doi: 10.3969/j.issn.1001-506X.2017.12.05
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WEI Zijie, CHEN Shengjian
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Abstract:
WEI Zijie, CHEN Shengjian. Fault diagnosis for circuits with tolerance based on multifeature cloud relational matrix#br#[J]. Systems Engineering and Electronics, 2017, 39(12): 2665-2670.
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URL: https://www.sys-ele.com/EN/10.3969/j.issn.1001-506X.2017.12.05
https://www.sys-ele.com/EN/Y2017/V39/I12/2665