Design of accelerated degradation testing with multiple stresses based on D optimality
GE Zheng-zheng1, JIANG Tong-min1, HAN Shao-hua2, LI Xiao-yang1
1. School of Reliability and System Engineering, Beihang University, Beijing 100191, China; 2. No.203 Institute of China Ordnance Industries, Xi’an 710065, China
GE Zheng-zheng, JIANG Tong-min, HAN Shao-hua, LI Xiao-yang. Design of accelerated degradation testing with multiple stresses based on D optimality[J]. Journal of Systems Engineering and Electronics, 2012, 34(4): 846-853.