Design of accelerated degradation testing with multiple stresses based on D optimality
GE Zheng-zheng, JIANG Tong-min, HAN Shao-hua, LI Xiao-yang
Journal of Systems Engineering and Electronics . 2012, (4): 846 -853 .  DOI: 10.3969/j.issn.1001-506X.2012.04.36