Reliability model for competing failure with shift thresholds
HUANG Wenping1, ZHOU Jinglun1, NING Juhong2, JIN Guang1
1. College of Information System and Management, National University of Defense Technology, Changsha 410073, China; 2. College of Mathematics and Information Science, Jiangxi Normal University, Nanchang 330027, China
HUANG Wenping, ZHOU Jinglun, NING Juhong, JIN Guang. Reliability model for competing failure with shift thresholds[J]. Systems Engineering and Electronics, doi: 10.3969/j.issn.1001-506X.2017.04.34.