机载电子设备BIT优化设计技术研究

Journal of Systems Engineering and Electronics ›› 2009, Vol. 31 ›› Issue (9): 2276-2279.

机载电子设备BIT优化设计技术研究

马存宝¹, 王彦文¹, 史浩山², 张韦¹

1. 西北工业大学航空学院, 陕西, 西安, 710072;
2. 西北工业大学电子信息学院, 陕西, 西安, 710072

收稿日期:2008-07-23 修回日期:2008-11-05 出版日期:2009-09-20 发布日期:2010-01-03
作者简介:马存宝(1963- ),男,教授,研究生,主要研究方向为测控、仿真和BIT技术.E-mail:caecmacb@nwpu.edu.cn
基金资助:
国家自然科学基金(60572173)资助课题

Study on BIT optimization design of airborne electronic equipment

MA Cun-bao¹, WANG Yan-wen¹, SHI Hao-shan², ZHANG Wei¹

1. School of Aeronautics, Northwestern Polytechnical Univ., Xi’an 710072, China;
2. School of Electronics and Information, Northwestern Polytechnical Univ., Xi’an 710072, China

Received:2008-07-23 Revised:2008-11-05 Online:2009-09-20 Published:2010-01-03

摘要/Abstract

摘要： 机内测试(built-in test,BIT)可以提高机载电子设备的任务可靠性,提升装备系统的任务效能。按照基于可靠性的BIT优化设计思想,分析了BIT对系统可靠性的影响,重点讨论了基于可靠性的BIT优化设计方法。提出了BIT优化设计的非线性整数规划(non-linear integer programming,NLIP)模型,并通过LINGO软件求解该模型。实例分析结果表明,该方法有效地降低了系统的故障率,提高了BIT设计指标。

Abstract: Built-in test(BIT) can improve the mission reliability of the system and enhance the mission effectiveness of equipment systems.The impact of BIT on the system is analyzed according to the BIT optimization design concept based on the reliability,the BIT optimization design methods based on reliability are mainly discussed,the non-linear integer programming(NLIP) model of the BIT optimization design is presented,and the model is calculated by LINGO.The results indicate that the system fault probability is decreased,and the performances of the BIT design are increased effectively by the proposed approach.

中图分类号:

V240.2

马存宝, 王彦文, 史浩山, 张韦. 机载电子设备BIT优化设计技术研究[J]. Journal of Systems Engineering and Electronics, 2009, 31(9): 2276-2279.

MA Cun-bao, WANG Yan-wen, SHI Hao-shan, ZHANG Wei. Study on BIT optimization design of airborne electronic equipment[J]. Journal of Systems Engineering and Electronics, 2009, 31(9): 2276-2279.

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