系统工程与电子技术

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顾及局部特性的自适应3D矢量场反距离权重插值法

孔龙星, 汤晓安, 张俊达, 王力   

  1. 国防科学技术大学电子科学与工程学院, 湖南 长沙 410073
  • 出版日期:2016-06-24 发布日期:2010-01-03

Adaptive IDW interpolation method involving local behavior for 3D vector field

KONG Long-xing, TANG Xiao-an, ZHANG Jun-da, WANG Li   

  1. College of Electronic Science and Engineering, National University of Defense Technology, Changsha 410073, China
  • Online:2016-06-24 Published:2010-01-03

摘要:

3D矢量场插值是拓扑分析与可视化应用的重要预处理步骤。针对反距离权重法(inverse distance weighted, IDW)在3D矢量场插值中参考样本选择缺乏科学指导以及无法反映矢量场局部特性的局限性,提出了一种顾及局部特性的自适应3D矢量场反距离权重插值法。首先基于距离影响度搜索初始样本集;然后对初始样本集进行分类,若其为小样本集直接采用IDW算法插值,若其为大样本集则基于矢量场局部线性近似进行优化得到优化样本集进行IDW算法插值。理论分析与实验结果表明,该方法能够自适应选择插值参考样本;并且插值结果在局部范围内符合矢量场的线性近似假设,插值结果更具有合理性;同时该方法还提高了IDW算法的插值精度。

Abstract:

3D vector field interpolation is an important preprocessing step before topology analysis and visualization. There are two shortcomings of the inverse distance weighted (IDW) method for 3D vector field interpolation. On the one hand, the selection of reference samples lacks of scientific guide. On the other hand, the local behavior of the vector field cannot be expressed. Considering these two shortcomings, an adaptive IDW interpolation method involving local behavior for 3D vector field is proposed. Firstly, the original sample set is searched based on the distance impact degree. Then, the original set is classified as small sample set or large sample set. In the case of the small sample set, it can be used for the IDW method directly. However, in the case of the large sample set, the optimal sample set for the IDW interpolation method can be acquired by the optimization step based on the local linear approximation of the vector field. Theoretical analysis and experiment results indicate that the proposed method can select the reference samples adaptively, and the interpolation result is more reasonable due to the assumption of local linear approximation of the vector field in the local range. The experiment results also show that proposed method improve the interpolation accuracy.