Journal of Systems Engineering and Electronics ›› 2011, Vol. 33 ›› Issue (3): 690-693.doi: 10.3969/j.issn.1001-506X.2011.03.44
鲁宇明1,2,黎明1,2 ,李凌1,杨红雨3
LU Yu-ming1, 2, LI Ming1, 2 , LI Ling1, YANG Hong-yu3
1. College of Automation, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China;
2. Key Laboratory of Nondestructive Testing (Ministry of Education), Nanchang Hangkong University, Nanchang 330063, China;
3. College of Electronic and Information Engineering, Beihang University, Beijing 100191, China