Journal of Systems Engineering and Electronics ›› 2010, Vol. 32 ›› Issue (8): 1604-1607.doi: 10.3969/j.issn.1001-506X.2010.08.11

• 电子技术 • 上一篇    下一篇

基于近场辐射的非接触式数字信号测试方法

谢楷1,王鹰2,李小平1,刘彦明1   

  1. (1. 西安电子科技大学机电工程学院, 陕西 西安 710071; 2. 第二炮兵装备研究院, 北京 100085)
  • 出版日期:2010-08-13 发布日期:2010-01-03

Non-contact digital signal testing method based on near-field radiation

XIE Kai1,WANG Ying2,LI Xiao-ping1,LIU Yan-ming1   

  1. (1. School of Electronical & Machanical Engineering, Xidian Univ., Xi’an 710071, China;
    2. Equipment Inst. of the Second Artillery, Beijing 100085, China)
  • Online:2010-08-13 Published:2010-01-03

摘要:

为解决自动测试系统的探针寿命及测试可靠性问题,提出一种针对数字电路的非接触式测试方法。利用平板天线及电荷放大器对节点近场辐射进行探测,通过边沿判别的方法恢复原始数字信号。讨论了天线模型、节点间串扰、判决门限选取等问题。给出了硬件实现方案,通过实验验证了该方法的有效性并测试其性能。

Abstract:

A non-contact testing method for digital circuit is provided to extend probe’s lifetime and increase reliability in automatic testing system (ATS). The near field radiation of circuit nodes is detected via a flat antenna and a charge amplifier, and the original digital signal is reconstructed by the edge-discriminate method. This paper focuses on the issue of antenna’s model, crosstalk between nodes and thresholds selection,and the hardware implementation is also proposed. The validity and performance of the method are verified.