Abstract:

An active appearance model(AAM) based on Gabor phase and local binary patterns(LBP) is presented. In comparison with the intensity based AAM， the proposed model improves the performance in three aspects: providing multi-scale and multi-direction Gabor texture which enhances the fitting accuracy of the model; improving the robustness to environmental changes, e.g., illumination; LBP based texture coding reduces a large amount of the redundency. Experimental results on various datasets demonstrate that the proposed model can effectively improve the fitting accuracy.