基于曲线拟合误差估计的阻抗优化识别方法

doi:10.12305/j.issn.1001-506X.2024.01.01

摘要/Abstract

摘要：

在雷达系统、舰船系统、数据中心等大型复杂系统中, 供配电系统变流器端口阻抗信息的完整、快速、准确获取, 是研判系统可靠性的重要基础。现有研究大都使用分段线性拟合值方法进行阻抗识别, 不仅需要大量阻抗测量才能获得完整的阻抗特性, 并且可能因过度测量而对系统的正常运行造成干扰。针对这些问题, 从阻抗特性曲线的非线性拟合入手, 提出一种“非线性曲线拟合、全局误差估计、优选测量点频率”的阻抗识别方法, 实现基于曲线拟合误差估计的测量点优化选择, 以较少阻抗测量代价获取宽频带阻抗特性。与现有的方法相比, 所提方法更有助于测量点的合理选择、阻抗谐振峰的准确识别, 从而更高效地实现宽频带阻抗的识别, 为复杂供配电系统运行状况的研判提供可靠依据。算例仿真证实了所提方法的有效性。

关键词: 非线性曲线拟合, 在线阻抗识别, 误差估计, 广义加性模型

Abstract:

For large and complex systems such as radar systems, ship systems, and data centers, the complete, rapid, and accurate acquisition of impedance information from the power supply and distribution system is essential for studying system reliability. Existing studies use linear fitting method for impedance identification, which may cause interference to the system operation due to excessive measurement. To address these issues, an impedance identification method is proposed based on nonlinear curve fitting algorithm, global error estimation, and optimal measurement point frequency. This method achieves optimal selection of measurement frequency points based on curve fitting error estimation, and obtains broadband impedance data with less impedance measurement. Compared with existing methods, the proposed method can help to estimate measurement errors more accurately; to select better measurement points, and to identify impedance resonance peaks faster, thereby efficiently realizing broadband impedance identification, providing a reliable basis for the research and judgment of the health status of power supply and distribution in complex systems. The effectiveness of the proposed method is verified by numerical simulation.

Key words: non-linear curve fitting, online impedance identification, error estimation, generalized additive model

中图分类号:

TM91

彭阳, 王跃, 刘永慧, 郜凯杰. 基于曲线拟合误差估计的阻抗优化识别方法[J]. 系统工程与电子技术, 2023, 46(1): 1-9.

Yang PENG, Yue WANG, Yonghui LIU, Kaijie GAO. Impedance optimization identification method based on curve fitting error estimation[J]. Systems Engineering and Electronics, 2023, 46(1): 1-9.

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