基于可靠性增长的可靠性鉴定试验方案

doi:10.12305/j.issn.1001-506X.2023.11.39

Abstract

Abstract:

To solve the problems that the current reliability qualification test (RQT) standard GJB-899A provides a test qualification plan that has long test time or high test risks, and most RQT designs only rely on the product's own life data currently, with rare utilization of reliability growth data during the product development, a reliability growth process during the product development phase is modeled for products with an exponential distribution of lifespan, based on the army material systems analysis activity (ASMAA) model. The Bayes method is used to obtain the product life distribution based on the test data of the product reliability growth process, calculate the producer and user risks of the product RQT plan, and then derive the product RQT plan that meets the risk requirements. The feasibility and progressiveness of the proposed method are verified by case analysis and comparison with the test scheme proposed by GJB-899A.

Key words: reliability qualification test (RQT), reliability growth process, exponential distribution, Bayes method

CLC Number:

TJ301

Dian ZHANG, Yunyan XING, Ping JIANG. Reliability qualification test plan based on reliability growth[J]. Systems Engineering and Electronics, 2023, 45(11): 3699-3705.

Figures/Tables 7

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References 30

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参数	标准定时截尾试验方案	基于可靠性增长过程的试验方案
判别标准	允许故障数=0	允许故障数=0
鉴别比d	2	2
截尾时间	T=185	T=55
试验风险	生产方α=0.3 使用方β=0.3	生产方α=0.25 使用方β=0.25

生产方风险	使用方风险	试验方案(T, C)
0.100	0.590	(20, 0)
0.200	0.343	(42, 0)
0.300	0.180	(68, 0)
0.250	0.250	(55, 0)
0.220	0.300	(47, 0)
0.286	0.200	(64, 0)
0.380	0.100	(93, 0)

生产方风险	鉴别比	研制要求失效率	试验截尾时间
0.25	2	0.010 0	55
0.25	2	0.007 5	69
0.25	2	0.005 0	97

生产方风险	鉴别比	试验时间	使用方风险
0.25	1.5	55	0.323 7
0.25	2	55	0.248 7
0.25	3	55	0.145 4

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Reliability qualification test plan based on reliability growth

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故障次数	故障时刻
1	2
2	15
3	20
4	41
5	47
6	97
7	120
8	219
9	281
10	307
11	372
12	403
13	556
14	628
15	732