Systems Engineering and Electronics ›› 2021, Vol. 43 ›› Issue (6): 1714-1720.doi: 10.12305/j.issn.1001-506X.2021.06.32
• Reliability • Previous Articles Next Articles
Yali ZHAI*, Zhihua ZHANG, Songshi SHAO
Received:
2020-06-24
Online:
2021-05-21
Published:
2021-05-28
Contact:
Yali ZHAI
CLC Number:
Yali ZHAI, Zhihua ZHANG, Songshi SHAO. Reliability modeling of products based on multiple degradation mechanism[J]. Systems Engineering and Electronics, 2021, 43(6): 1714-1720.
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