Systems Engineering and Electronics ›› 2020, Vol. 42 ›› Issue (4): 954-959.doi: 10.3969/j.issn.1001-506X.2020.04.29
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Ao ZHANG1(), Zhihua WANG1(
), Zhenping ZHAO2(
), Xuguo QIN2(
), Qiong WU3(
), Chengrui LIU4(
)
Received:
2019-07-15
Online:
2020-03-28
Published:
2020-03-28
Supported by:
CLC Number:
Ao ZHANG, Zhihua WANG, Zhenping ZHAO, Xuguo QIN, Qiong WU, Chengrui LIU. Two-phase nonlinear Wiener process for degradation modeling and reliability analysis[J]. Systems Engineering and Electronics, 2020, 42(4): 954-959.
1 | 胡昌华, 施权, 司小胜, 等. 数据驱动的寿命预测和健康管理技术研究进展[J]. 信息与控制, 2017, 46 (1): 72- 82. |
HU C H , SHI Q , SI X S , et al. Data-driven life prediction and health management: state of the art[J]. Information and Control, 2017, 46 (1): 72- 82. | |
2 |
王小林, 程志君, 郭波. 基于维纳过程金属化膜电容器的剩余寿命预测[J]. 国防科技大学学报, 2011, 33 (4): 146- 151.
doi: 10.3969/j.issn.1001-2486.2011.04.028 |
WANG X L , CHENG Z J , GUO B . Residual life forecasting of metallized film capacitor based on Wiener process[J]. Journal of National University of Defense Technology, 2011, 33 (4): 146- 151.
doi: 10.3969/j.issn.1001-2486.2011.04.028 |
|
3 | YE Z S , XIE M . Stochastic modelling and analysis of degradation for highly reliable products[J]. Applied Stochastic Models in Business & Industry, 2015, 31 (1): 16- 32. |
4 | 蔡忠义, 陈云翔, 郭建胜, 等. 考虑测量误差和随机效应的设备剩余寿命预测[J]. 系统工程与电子技术, 2019, 41 (7): 1658- 1664. |
CAI Z Y , CHEN Y X , GUO J S , et al. Remaining lifetime prediction for device with measurement error and random effect[J]. Systems Engineering and Electronics, 2019, 41 (7): 1658- 1664. | |
5 |
PANDEY M D , YUAN X X , VAN N J M . The influence of temporal uncertainty of deterioration on life-cycle management of structures[J]. Structure and Infrastructure Engineering, 2009, 5 (2): 145- 156.
doi: 10.1080/15732470601012154 |
6 |
刘小平, 张立杰, 沈凯凯, 等. 考虑测量误差的步进加速退化试验建模与剩余寿命估计[J]. 兵工学报, 2017, 38 (8): 1586- 1592.
doi: 10.3969/j.issn.1000-1093.2017.08.017 |
LIU X P , ZHANG L J , SHEN K K , et al. Step stress accelerated degradation test modeling and remaining useful life estimation in consideration of measuring error[J]. Acta Armamentarii, 2017, 38 (8): 1586- 1592.
doi: 10.3969/j.issn.1000-1093.2017.08.017 |
|
7 |
ZHANG Z , SI X , HU C , et al. Degradation data analysis and remaining useful life estimation: a review on Wiener-process-based methods[J]. European Journal of Operational Research, 2018, 271 (3): 775- 796.
doi: 10.1016/j.ejor.2018.02.033 |
8 | 黄金波, 孔德景, 崔利荣. 多阶段可校正系统退化建模与可靠性评估[J]. 系统工程与电子技术, 2016, 38 (4): 965- 969. |
HUANG J B , KONG D J , CUI L R . Degradation modeling and reliability assessment of multi-stage system with calibrations[J]. Systems Engineering and Electronics, 2016, 38 (4): 965- 969. | |
9 | 王小林, 郭波, 程志君. 基于分阶段Wiener-Einstein过程设备的实时可靠性评估[J]. 中南大学学报(自然科学版), 2012, 43 (2): 534- 540. |
WANG X L , GUO B , CHENG Z J . Real-time reliability evaluation of equipment based on separated-phase Wiener-Einstein process[J]. Journal of Central South University (Science and Technology), 2012, 43 (2): 534- 540. | |
10 |
WANG X , JIANG P , GUO B , et al. Real-time reliability evaluation for an individual product based on change-point Gamma and Wiener process[J]. Quality and Reliability Engineering, 2014, 30 (4): 513- 525.
doi: 10.1002/qre.1504 |
11 | BAE S J , KVAM P H . A change-point analysis for modeling incomplete burn-in for light displays[J]. ⅡE Transactions, 2006, 38 (6): 489- 498. |
12 | WANG P , TANG Y , BAE S J , et al. Bayesian analysis of two-phase degradation data based on change-point Wiener process[J]. Reliability Engineering & System Safety, 2018, 170, 244- 256. |
13 |
FENG J , SUN Q , JIN T . Storage life prediction for a high-performance capacitor using multi-phase Wiener degradation model[J]. Communications in Statistics-Simulation and Computation, 2012, 41 (8): 1317- 1335.
doi: 10.1080/03610918.2011.624241 |
14 | 王小林, 郭波, 程志君. 基于非线性漂移Wiener过程的产品实时可靠性评估[J]. 中南大学学报(自然科学版), 2013, 44 (8): 3203- 3209. |
WANG X L , GUO B , CHEN Z J . Real-time reliability evaluation for product with nonlinear drift-based Wiener process[J]. Journal of Central South University (Science and Technology), 2013, 44 (8): 3203- 3209. | |
15 |
TSENG S T , TANG J , KU I H . Determination of burn-in parameters and residual life for highly reliable products[J]. Naval Research Logistics, 2003, 50 (1): 1- 14.
doi: 10.1002/nav.10042 |
16 |
魏高乐, 陈志军. 基于多阶段-随机维纳退化过程的产品剩余寿命预测方法[J]. 科学技术与工程, 2015, 15 (26): 27- 34.
doi: 10.3969/j.issn.1671-1815.2015.26.004 |
WEI G L , CHEN Z J . Prediction of residual life of products based on multi-stage stochastic Wiener degradation process[J]. Science and Technology Engineering, 2015, 15 (26): 27- 34.
doi: 10.3969/j.issn.1671-1815.2015.26.004 |
|
17 |
叶海福, 姚永和, 于成龙. 高压脉冲电容器电容量漂移的研究[J]. 高电压技术, 2007, 33 (6): 37- 41.
doi: 10.3969/j.issn.1003-6520.2007.06.010 |
YE H F , YAO Y H , YU C L . Capacitance variability of high voltage pulse capacitors[J]. High Voltage Engineering, 2007, 33 (6): 37- 41.
doi: 10.3969/j.issn.1003-6520.2007.06.010 |
|
18 |
SI X S , WANG W , HU C H , et al. Remaining useful life estimation based on a nonlinear diffusion degradation process[J]. IEEE Trans.on Reliability, 2012, 61 (1): 50- 67.
doi: 10.1109/TR.2011.2182221 |
19 |
YE Z S , WANG Y , TSUI K L , et al. Degradation data analysis using wiener processes with measurement errors[J]. IEEE Trans.on Reliability, 2013, 62 (4): 772- 780.
doi: 10.1109/TR.2013.2284733 |
20 |
WANG X , JIANG P , GUO B , et al. Real-time reliability evaluation with a general Wiener process-based degradation model[J]. Quality and Reliability Engineering, 2014, 30 (2): 205- 220.
doi: 10.1002/qre.1489 |
21 |
张永强, 刘琦, 周经伦. 基于幂律退化轨道的小样本性能可靠性评定[J]. 航空计算技术, 2006, (3): 115- 118.
doi: 10.3969/j.issn.1671-654X.2006.03.032 |
ZHANG Y Q , LIU Q , ZHOU J L . Small sampling reliability evaluation based on power law degradation model[J]. Aeronautical Computing Technique, 2006, (3): 115- 118.
doi: 10.3969/j.issn.1671-654X.2006.03.032 |
|
22 |
KAWAKUBO Y , MIYAZAWA S , NAGATA K , et al. Wear life prediction of contact recording head[J]. IEEE Trans.on Magnetics, 2003, 39 (2): 888- 892.
doi: 10.1109/TMAG.2003.808915 |
23 |
TSENG S T , TANG J , KU I H . Determination of burn-in parameters and residual life for highly reliable products[J]. Naval Research Logistics, 2003, 50 (1): 1- 14.
doi: 10.1002/nav.10042 |
24 |
NG T S . An application of the EM algorithm to degradation modeling[J]. IEEE Trans.on Reliability, 2008, 57 (1): 2- 13.
doi: 10.1109/TR.2008.916867 |
25 | 黎明.带随机拐点的退化失效建模与分析方法研究[D].长沙:国防科学技术大学, 2009. |
LI M. Research on the degradation-failure modeling and analysis methods of degradation path with random change-points[D]. Changsha: National University of Defense Technology, 2009. | |
26 |
邓爱民, 陈循, 张春华, 等. 基于性能退化数据的可靠性评估[J]. 宇航学报, 2006, 27 (3): 546- 552.
doi: 10.3321/j.issn:1000-1328.2006.03.044 |
DENG A M , CHEN X , ZHANG C H , et al. Reliability assessment based on performance degradation data[J]. Journal of Astronautics, 2006, 27 (3): 546- 552.
doi: 10.3321/j.issn:1000-1328.2006.03.044 |
|
27 | WEN Y , WU J , DAS D , et al. Degradation modeling and RUL prediction using Wiener process subject to multiple change points and unit heterogeneity[J]. Reliability Engineering & System Safety, 2018, 176, 113- 124. |
28 | AKAIKE H . A new look at the statistical model identification[J]. IEEE Trans.on Automatic Control, 1975, 19 (6): 716- 723. |
29 |
叶海福, 姚永和, 于成龙. 膜纸复合型高压脉冲电容器电容量漂移的研究[J]. 高压电器, 2007, 43 (1): 32- 34.
doi: 10.3969/j.issn.1001-1609.2007.01.010 |
YE H F , YAO Y H , YU C L . Research on capacitance variability of high voltage pulse capacitors composed of polypropylene and paper[J]. High Voltage Apparatus, 2007, 43 (1): 32- 34.
doi: 10.3969/j.issn.1001-1609.2007.01.010 |
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