Abstract:

Testability allocation is a process of assigning system-level testability indicators to units according to certain rules. In view of the current mainstream allocation methods which donot consider mutual test among units, and then cause unreasonable allocation results, such as being difficult to achieve or costing too much, an testability index allocation method is proposed, which considers not only the conventional factors such as the unit failure rate and the failure hazard, but also the factors of the unit mutual test. Firstly, the primary allocation considering multiple factors is implemented. Secondly, based on the preliminary testability designing of units, the testability modeling and analysis are carried out to obtain the fault self-detection rate and the fault nonself-detection rate. Thirdly, the secondary allocation is implemented by using the two data and the primary allocation results to achieve the final allocation results. Finally, the method is applied to simulation and exemplifying, which proves its validity and advancement.

Key words: testability allocation, fault detection rate, allocation function, fault nonself-detection rate, inverse cotangent function