Systems Engineering and Electronics ›› 2019, Vol. 41 ›› Issue (1): 208-214.doi: 10.3969/j.issn.1001-506X.2019.01.29
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DONG Wenjie, LIU Sifeng, FANG Zhigeng, CAO Yingsai, ZHANG Qin
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Abstract:
DONG Wenjie, LIU Sifeng, FANG Zhigeng, CAO Yingsai, ZHANG Qin. Reliability evaluation of degradation failure based on HGERT network model[J]. Systems Engineering and Electronics, 2019, 41(1): 208-214.
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URL: https://www.sys-ele.com/EN/10.3969/j.issn.1001-506X.2019.01.29
https://www.sys-ele.com/EN/Y2019/V41/I1/208