Systems Engineering and Electronics

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Reliability model for competing failure with shift thresholds

HUANG Wenping1, ZHOU Jinglun1, NING Juhong2, JIN Guang1   

  1. 1. College of Information System and Management, National University of Defense Technology, Changsha 410073, China; 2. College of Mathematics and Information Science, Jiangxi Normal University, Nanchang 330027, China
  • Online:2017-03-23 Published:2010-01-03

Abstract:

The system is supposed to the subject to the continuous degradation process and the shock process. This paper assumes that the degradation continuously increases with a linear path, and the external shock is considered as two classic shock models, i.e., extreme shock model and δ shock model. After analyzing the effect of the degradation on the traumatic failure threshold, the reliability model with shifting failure thresholds is presented, and the analytical expression of the system reliability is derived. The results of the model are discussed, in additional, the sensitivity analysis of traumatic failure thresholds is conducted. The result shows that the model can improve the precision of reliability assessment, and it can be used as references to the theory research and project application.

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