Systems Engineering and Electronics
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ZHAO Yu-xin, CHANG Shuai, WAN Cheng-cheng
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Abstract:
The test effort is an important factor which affects the software testing process. It changes as time goes by, which has a direct impact on the efficiency of the fault detection and correction in the process of testing. Assessing the effect of testing process on the test effort reasonably is the key factor to build a precise software reliability model. Aiming at the existing models’ lack of understanding of test effort, the test effort is divided into fault detection effort and fault correction effort, according to the actual test situation. Then a software reliability growth model considering the two efforts is established and evaluated using a group of public dada. The results show that compared with the existing models considering fault detection and correction process, the proposed model has better fitting and prediction ability.
ZHAO Yu-xin, CHANG Shuai, WAN Cheng-cheng. Software reliability growth model considering fault detection effort and fault correction effort[J]. Systems Engineering and Electronics, doi: 10.3969/j.issn.1001-506X.2015.04.38.
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URL: https://www.sys-ele.com/EN/10.3969/j.issn.1001-506X.2015.04.38
https://www.sys-ele.com/EN/Y2015/V37/I4/969