Fast diagnosis approach for defective array elements using nonconvexcompressed sensing with planar nearfield measurements
LI Wei1,2, DENG Weibo1,2, YANG Qiang1,2, MARCO Donald Migliore3
1. School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin 150001, China;
2. Key Laboratory of Marine Environmental Monitoring and Information Processing, Ministry of Industry and Iformation Technology, Harbin 150001, China;
3. School of Computer Science and elecommunications Engineering, University of Cassino, Cassino 03043, Italy
LI Wei, DENG Weibo, YANG Qiang, MARCO Donald Migliore. Fast diagnosis approach for defective array elements using nonconvexcompressed sensing with planar nearfield measurements[J]. Systems Engineering and Electronics, 2019, 41(6): 1173-1179.