Reliability analysis for B-S components under progressive hybrid Type I censoring test
SUN Tian-yu1,2, SHI Yi-min1, WEI Wei2
1. Department of Applied Mathematics, School of Science, Northwestern Polytechnical University, Xi’an 710072, China;
2. Xi’an Modern Control Technology Research Institute, Xi’an 710065, China
SUN Tian-yu, SHI Yi-min, WEI Wei. Reliability analysis for B-S components under progressive hybrid Type I censoring test[J]. Systems Engineering and Electronics, doi: 10.3969/j.issn.1001-506X.2014.11.34.