Systems Engineering and Electronics
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ZHAO Yu-xin,CHANG Shuai,WAN Cheng-cheng
Online:
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Abstract:
The test effort function (TEF) can not only describe the change of resources consumed with time, but also be the premise and foundation of the software reliability growth model considering the test effort function. There are more than ten kinds of existing TEFs. Due to poor applicability, the researchers have very big workload in modeling and the result is not satisfactory. A new function form of TEF is proposed. The function form is more flexible and applicable. On this basis, the software reliability growth model based on the TEF is established. Two sets of public data are used to evaluate its effectiveness. The results show that the proposed function is effective and feasible and the 〖JP2〗software reliability growth model based on this function has better performance and adaptation.
ZHAO Yu-xin,CHANG Shuai,WAN Cheng-cheng. Software reliability growth model based on test effort function[J]. Systems Engineering and Electronics, doi: 10.3969/j.issn.1001-506X.2014.10.34.
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URL: https://www.sys-ele.com/EN/10.3969/j.issn.1001-506X.2014.10.34
https://www.sys-ele.com/EN/Y2014/V36/I10/2102