逐步增加I型混合截尾试验下B-S部件的可靠性分析

孙天宇, 师义民, 卫炜

Reliability analysis for B-S components under progressive hybrid Type I censoring test

SUN Tian-yu, SHI Yi-min, WEI Wei

系统工程与电子技术 . 2014, (11): 2326 -2331 . DOI: 10.3969/j.issn.1001-506X.2014.11.34