威布尔产品加速寿命试验的可靠性分析

李凌，徐伟

Reliability analysis for accelerated life test based on Weibull distribution

LI Ling, XU Wei

Journal of Systems Engineering and Electronics . 2010, (7): 1544 -1548 . DOI: 10.3969/j.issn.1001506X.2010.07.045