二项式分布场合加速退化零失效可靠性验证试验
黄秀平, 周经伦, 孙权, 冯静
Reliability demonstration through accelerated degradation zero-failure testing under binomial distribution
HUANG Xiuping, ZHOU Jinglun, SUN Quan, FENG Jing
Journal of Systems Engineering and Electronics
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2012, (9): 1951
-1956
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DOI: 10.3969/j.issn.1001-506X.2012.09.35
