基于位平面熵及分布熵的图像检索

Journal of Systems Engineering and Electronics ›› 2009, Vol. 31 ›› Issue (3): 719-722.

基于位平面熵及分布熵的图像检索

孙君顶^1,2, 毋小省¹

1. 河南理工大学计算机科学与技术学院, 河南, 焦作, 454000;
2. 苏州大学江苏省计算机信息处理技术重点实验室, 江苏, 苏州, 215006

收稿日期:2007-10-08 修回日期:2008-02-29 出版日期:2009-03-20 发布日期:2010-01-03
作者简介:孙君顶(1975- ),男,博士,副教授,主要研究方向为多媒体技术,基于内容的图像检索.E-mail:sunjd@hpu.edu.cn
基金资助:
河南省教育厅自然科学基础研究基金(2007520019,2008B520012);河南省基础与前沿技术研究计划项目(072300460050);苏州大学江苏省计算机信息处理技术重点实验室开放基金(KJS0715);河南理工大学博士基金(B050901);河南理工大学骨干教师基金资助课题

Image retrieval based on bit-plane entropy and spatial entropy

SUN Jun-ding^1,2, WU Xiao-sheng¹

1. School of Computer Science and Technology, Henan Polytechnic Univ., Jiaozuo 454000, China;
2. Provincial Key Lab. of Computer Information Processing Technology, Suzhou Univ., Suzhou 215006, China

Received:2007-10-08 Revised:2008-02-29 Online:2009-03-20 Published:2010-01-03

摘要/Abstract

摘要： 针对基于位平面熵进行图像检索存在的问题,提出了位平面熵的改进方法。该算法采用改进的位平面熵来消除熵的对称性对检索效果造成的影响。提出采用位平面分布熵来描述位平面的空间特征,解决了仅依靠位平面熵检索效率低的问题。结合位平面熵及位平面分布熵,给出了图像间的相似性度量准则。仿真实验证明,该算法无论在检索率、精确度还是平均正确率上都具有更好的检索效果。

Abstract: For the image retrieval method based on bit-plane entropy(BE),the main problems are that it is easily affected by the symmetry of entropy and does not take the bit-plane spatial distribution feature into consideration.In order to remove the effect of these two drawbacks,a novel image retrieval algorithm is proposed.Firstly,enhanced bit-plane entropy(EBE) is introduced to avoid the influence of the symmetry of entropy.Then,bit-plane spatial entropy(SE) is presented to describe the spatial feature of a bit-plane.Based on EBE and SE,the similarity of images is discussed in detail and three measures are given.In comparison with bit-plane distribution entropy,experiment results show that the proposed method gives better performance.

中图分类号:

TP391.3

孙君顶, 毋小省. 基于位平面熵及分布熵的图像检索[J]. Journal of Systems Engineering and Electronics, 2009, 31(3): 719-722.

SUN Jun-ding, WU Xiao-sheng. Image retrieval based on bit-plane entropy and spatial entropy[J]. Journal of Systems Engineering and Electronics, 2009, 31(3): 719-722.