系统工程与电子技术 ›› 2026, Vol. 48 ›› Issue (3): 872-882.doi: 10.12305/j.issn.1001-506X.2026.03.14

• 系统工程 • 上一篇    

融合设计与试验信息的弹上产品贮存寿命评估方法

张生鹏1,2,*, 黄硕2, 徐如远2, 马小兵1   

  1. 1. 北京航空航天大学可靠性与系统工程学院,北京 100191
    2. 航天科工防御技术研究试验中心,北京 100854
  • 收稿日期:2024-11-15 出版日期:2026-03-25 发布日期:2026-04-13
  • 通讯作者: 张生鹏
  • 作者简介:黄 硕(1992—),男,研究员,博士,主要研究方向为质量与可靠性、数字化试验
    徐如远(1995—),男,助理工程师,硕士,主要研究方向为质量与可靠性、环境试验
    马小兵(1978—),男,教授,博士,主要研究方向为结构可靠性、可靠性评估

Storage life evaluation method for missile-borne products integrating information from design and testing

Shengpeng ZHANG1,2,*, Shuo HUANG2, Ruyuan XU2, Xiaobing MA1   

  1. 1. School of Reliability and Systems Engineering,Beihang University,Beijing 100191,China
    2. Aerospace Science and Industry Defense Technology Research Testing Center,Beijing 100854,China
  • Received:2024-11-15 Online:2026-03-25 Published:2026-04-13
  • Contact: Shengpeng ZHANG

摘要:

弹上产品贮存寿命评估未充分利用设计信息、失效判据未直接反映耗损期失效机理,如何在考虑上述问题的基础上进一步深入研究多参数耦合下的贮存寿命评估具有重要意义。为此,提出一种融合设计与试验多源信息的弹上产品贮存寿命评估方法。首先,以失效率作为寿命判据构建贮存寿命表征指标,分析贮存寿命影响因素,明确设计和试验信息来源。其次,基于广义应力-强度干涉模型,构建综合考虑设计参数的离散型、贮存工况的随机性及性能参数退化的产品失效率模型。再次,利用Copula函数将失效率模型泛化到多参数的情形,给定失效率阈值,通过遗传算法估计贮存寿命。最后,以一种控制放大器为例,验证了所提方法的有效性。分析表明,所提方法有效解决了目前存在的设计参数与贮存寿命指标不相关的问题,为支撑贮存寿命正向设计与准确评估提供了有力支撑。

关键词: 弹上产品, 失效率模型, 设计信息, 试验信息, 贮存寿命评估, Copula函数

Abstract:

Storage life evaluation of missile-borne products do not fully utilize design information, and failure criteria do not directly reflect the failure mechanisms during the depletion phase. Conducting an in-depth study on storage life evaluation under multi-parameter coupling while considering these issues is of great significance. In regard to this, a storage life evaluation method for evaluating the storage life of missile-borne products by integrating multiple sources of design and experimental information is proposed. Firstly, a storage life characterization index is established using failure rate as the lifespan criterion, the influencing factors of storage life is analyzed, and the sources of design and test information is clarified. Secondly, based on the generalized stress-strength interference model, a product failure rate model is constructed that comprehensively considers the discreteness of design parameters, the randomness of storage conditions, and the degradation of performance parameters. Thirdly, the failure rate model is generalized to a multi-parameter scenario using the Copula function. Given a failure rate threshold, the storage life is estimated through genetic algorithm. Finally, taking a control amplifier as an example, the effectiveness of the proposed method is verified. The analysis shows that the proposed method effectively solves the problem of design parameters being unrelated to storage life indicators, providing strong support for the positive design and accurate evaluation of storage life.

Key words: missile-borne product, failure rate model, design information, testing information, storage life evaluation, Copula function

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