考虑测量误差和随机效应的设备剩余寿命预测#br#
蔡忠义, 陈云翔, 郭建胜, 王泽洲, 邓林
Remaining lifetime prediction for device with measurement error and random effect
CAI Zhongyi, CHEN Yunxiang, GUO Jiansheng, WANG Zezhou, Deng Lin
系统工程与电子技术
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2019, (7): 1658
-1664
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DOI: 10.3969/j.issn.1001-506X.2019.07.30
