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骆明珠，陈颖，康锐

Method for reliability parameter calculation of electronic products  based on physics of failure models

LUO Ming-zhu， CHEN Ying， KANG Rui

系统工程与电子技术 . 2014, (4): 795 -801 . DOI: 10.3969/j.issn.1001-506X.2014.04.31