Remaining lifetime online prediction based on step-stress accelerated degradation modeling
CAI Zhongyi, GUO Jiansheng, CHEN Yunxiang, DONG Xiaoxiong, XIANG Huachun
Systems Engineering and Electronics . 2018, (11): 2605 .  DOI: 10.3969/j.issn.1001-506X.2018.11.31