Reliability assessment method with integrated prior accelerated degradation and field degradation data
CAI Zhong-yi, CHEN Yun-xiang, XIANG Hua-chun, LUO Cheng-kun
Systems Engineering and Electronics . 2016, (4): 970 -976 .  DOI: 10.3969/j.issn.1001-506X.2016.04.36