Review on reliability of electronic devices in deep space environment
Qilong GUAN, Chunjin HANG, Shengli LI, Xiaojiu TANG, Dan YU, Ying DING
Systems Engineering and Electronics . 2025, (4): 1184 -1194 .  DOI: 10.12305/j.issn.1001-506X.2025.04.15