Systems Engineering and Electronics ›› 2019, Vol. 41 ›› Issue (4): 929-936.doi: 10.3969/j.issn.1001-506X.2019.04.32
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CHEN Zhen, PAN Hao, PAN Ershun
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Abstract:
CHEN Zhen, PAN Hao, PAN Ershun. Differentiated design of constant stress accelerated degradation test[J]. Systems Engineering and Electronics, 2019, 41(4): 929-936.
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URL: https://www.sys-ele.com/EN/10.3969/j.issn.1001-506X.2019.04.32
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