Systems Engineering and Electronics ›› 2018, Vol. 40 ›› Issue (8): 1750-1753.doi: 10.3969/j.issn.1001-506X.2018.08.12
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LI Zenghui1,2, LI Jianxun1, LI Guangwei1, WANG Entang2
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Abstract:
LI Zenghui, LI Jianxun, LI Guangwei, WANG Entang. Statistical inference toward lower digits truncated Rayleigh noise[J]. Systems Engineering and Electronics, 2018, 40(8): 1750-1753.
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URL: https://www.sys-ele.com/EN/10.3969/j.issn.1001-506X.2018.08.12
https://www.sys-ele.com/EN/Y2018/V40/I8/1750