Journal of Systems Engineering and Electronics ›› 2010, Vol. 32 ›› Issue (7): 1544-1548.doi: 10.3969/j.issn.1001506X.2010.07.045
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LI Ling, XU Wei
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Published:
Abstract:
In order to make inference about problems of accelerated life test plan under different experiments, a stepstress accelerated life test model of units based on Weibull lifetimes is given. For this model, the maximum likelihood estimates of the parameters in normal stress level are derived under TypeII censoring. The NewtonRaphson method is using to solve the likelihood equations, and a simplified estimator is presented, which is used as an initial estimate in the iterative process. Bootstrap confidence intervals for the parameters are provided. Some numerical results for solid tantalum electrolytic capacitor are discussed to illustrate validity of this model.
LI Ling, XU Wei. Reliability analysis for accelerated life test based on Weibull distribution[J]. Journal of Systems Engineering and Electronics, 2010, 32(7): 1544-1548.
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URL: https://www.sys-ele.com/EN/10.3969/j.issn.1001506X.2010.07.045
https://www.sys-ele.com/EN/Y2010/V32/I7/1544