Abstract:

Existing testability demonstration test schemes need large fault sample size with a specified risk level. To solve this problem, taking the fault detection rate (FDR) as a target, one kind of Bayesian method for determining testability demonstration test scheme is proposed. The proposed method first establishes an FDR growth model describing the changing trend of FDR based on the test data acquired in the development stage and then employs the expert information to decide model parameters. After that, the prior distribution of FDR can be easily obtained through the above model. Finally, a new testability demonstration test scheme is defined according to the Bayesian maximum posterior risk rule. Compared with the classical counterpart, the new test scheme has an obvious effect on reducing the fault sample size, and lowering the risk of both sides greatly.