Abstract:

Reliability modeling and evaluation for the liquid coupling device (LCD) degradation process are studied. There are two phases in the LCD degradation process. That is to say, there is a change-point in the degradation of LCD, and the LCD follows different degradation processes before and after the change-point. According to the traditional method, the reliability analysis focuses only on the second phase, which ighores the information of the first phase. In view of this, the two-stage Wiener degradation process model is established, and the reliability function is deduced. The change-point between the two phases is obtained based on the Schwarz information criterion (SIC). Finally, the method is applied to evaluate the reliability of LCD and compared with the traditional method. The results show that the two-phase Wiener degradation model can depict the LCD degradation process effectively, and the more believable evaluation result is gained by the proposed method.