Automatic generation of test cases for payload system based on improved OOPN
HE Yu-feng1,2,ZHAO Guang-heng1,GUO Li-li1,Lv Cong-min1
1. Academy of Optoelectronics, Chinese Academy of Sciences, Beijing 100080, China;
2. Graduate Univ. of Chinese Academy of Sciences, Beijing 100080, China
HE Yu-feng,ZHAO Guang-heng,GUO Li-li,Lv Cong-min. Automatic generation of test cases for payload system based on improved OOPN[J]. Journal of Systems Engineering and Electronics, 2010, 32(11): 2470-2475.