Abstract:

A test design methodology based on normal distribution Bayesian sequential test theory is proposed. It provides the theoretical basis for the determination of test number of a smallsamplesize dynamic test for long-working systems with different types of technical specifications. It takes the conformity probabilities of single sample test for the target system as statistical observed values, and assumes that the observed values series from different dynamic tests of target systems are conformed to normal distribution. Then the multi-specification sequential test process of target systems can be designed by using Bayesian sequential posterior odd test theory on normal distribution. And the detailed realization procedures on handling priori information, designing the Bayesian sequential testing and sequential censor solution, calculating the upper bound of increased sequential censor risks, and valuating the overall conformity probability of each technical specification are given. Finally, a simulation example by applying the approach is given, and the corresponding test results show that the approach is feasible.