基于CGSPN的复杂电子系统测试性参数确定方法

doi:10.12305/j.issn.1001-506X.2025.05.15

Abstract

Abstract:

Due to the extensive use of distributed, integrated, and modular solutions, complex electronic systems are prone to new issues such as common-cause failures and fault concurrency, which are difficult to address using traditional methods for determining testability parameters. To address the above issue, a novel method for determining testability parameters for complex electronic systems based on colored generalized stochastic Petri nets (CGSPN) is proposed. Firstly, by incorporating requirements such as demand information, constraint boundaries, and maintenance support, a two-level CGSPN model for electronic systems is established. Coloring is introduced to enable real-time tracking of various states of different modules and to handle fault concurrency, while generalized stochastic processing addresses the randomness of common-cause failures.Secondly, a testability parameter processing method incorporating redundancy design is explored through coloring and availability, which enriches the testability system. Finally, a parallel analysis technique integrating different modules and various states is developed, unifying the state transition relationships between system and module levels, and avoiding stage-wise serial processing and equivalent replacement. An example analysis of communication navigation identification (CNI) system demonstrates that the proposed method offers better usability and effectiveness compared to traditional approaches.

Key words: electronic systems, testability parameters, colored generalized stochastic Petri nets (CGSPN), common-cause failures, fault concurrency

CLC Number:

TP206
TH702

Chao ZHANG, Yingtao FANG, Zhijie DONG, Shilie HE, Zhenwei ZHOU. Research ondetermination method for testability parameters of complex electronic systems based on CGSPN[J]. Systems Engineering and Electronics, 2025, 47(5): 1525-1535.

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库所符号	含义
P₀	LRM_i模块正常工作
P_{1_i}	LRM_i模块处于故障状态
P_{2_i}	故障检测结束
P_{3_i}	故障无法检测
P_{4_i}	检测到故障
P_{5_i}	人工隔离结束
P_{6_i}	故障修复结束
P_{7_i}	机器隔离结束
P_{8_i}	故障不能隔离
P_{9_i}	故障已隔离
P₁₀	CBM正常
P₁₁	CBM故障

变迁符号	单位	含义
t_{0_i}	h^－1	发生虚警速率
t_{1_i}	h^－1	发生故障速率
t_{2_i}	h^－1	故障检测速率
t_{3_i}	—	故障不能检测率
t_{4_i}	—	故障检测率
t_{5_i}	h^－1	人工隔离速率
t_{6_i}	h^－1	强制性维修速率
t_{7_i}	h^－1	机器隔离速率
t_{8_i}	—	故障不能隔离率
t_{9_i}	—	故障隔离率
t_{10_i}	h^－1	模糊维修速率
t_{11_i}	h^－1	精确维修速率
t_{12_i}	h^－1	检验安装速率
t₁₃	h^－1	CBM发生故障速率
t₁₄	h^－1	CBM故障修复速率

单元	λ_{_i}	μ_{1_i}	μ_{2_i}	μ_{3_i}	μ_{4_i}	MTTR	λ_{_g}	μ_{_g}
LRM_1	0.01	2	1	2	1	t	—	—
LRM_2	0.02	4	2	4	0.8	0.8t	—	—
LRM_3	0.03	2	1	2	0.8	1.2t	—	—
LRM_4	0.04	1	0.5	1	0.3	2t	—	—
LRM_5	—	—	—	—	—	—	0.01	1

单元	测试性参数
单元	η_{D_i}/h^-1	η_{I_i}/h^-1	η_{P_i}/h^-1	γ_{FD_i}	γ_{FI_i}	λ_{FA_i}/h^-1	γ_{FA_i}/%
LRM_1	10	10	0.5	0.90	0.85	0.000 47	4.49
LRM_2	10	5	0.5	0.90	0.80	0.000 65	3.15
LRM_3	10	5	0.5	0.70	0.70	0.002 90	8.81
LRM_4	10	5	0.5	0.85	0.80	0.000 39	0.97

方法	算法对比分析
方法	随机性问题	不确定性问题	并发问题	冗余问题	共因问题	特点
类比法	×	×	×	×	×	不合理, 需要类似装备。
经验法	×	×	×	×	×	不合理, 需要以往经验。
权衡法	×	×	×	×	×	不合理, 需要类似装备。
PN	×	×	×	×	×	无法处理随机性和时间因素, 因此不适合建模具有时序和随机性的系统。
SPN	√	×	×	√	√	无法处理时间因素, 因此不适合建模具有时序的系统。
GSPN	√	√	×	√	√	可以描述系统不确定性与随机性, 无法描述故障并发问题, 面对复杂系统建模能力有限。
DSPN	√	√	×	√	√	在GSPN基础上增加确定时间变迁, 但依旧无法描述故障并发问题, 面对复杂系统建模能力有限。
CGSPN	√	√	√	√	√	由于引入着色概念, 能够处理系统并发问题, 建模更加灵活, 能够更好地描述多类资源的系统行为。

Research ondetermination method for testability parameters of complex electronic systems based on CGSPN

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